| Abstract Scope |
This project investigates the use of low-kV scanning electron microscopy for imaging creep-deformed polycrystalline Rene 65 subjected to multiple heat treatments and aging conditions. Secondary electron imaging was performed using advanced techniques and detectors to enhance surface sensitivity and deformation-related contrast while minimizing interaction volume. These optimized beam parameters show promise for improved image sharpness and contrast associated with ã/ã′ microstructure and deformation-induced surface relief, providing a consistent basis for comparative imaging. Ongoing and future work will expand this characterization framework to include EBSD for grain orientation and texture analysis, additional SEM imaging focused on grain boundary phases, and advanced STEM techniques including ECCI and TKD to further interrogate deformation structures. |