About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Novel Strategies for Rapid Acquisition and Processing of Large Datasets From Advanced Characterization Techniques
|
| Presentation Title |
A Topology Optimized Specimen that Provides the Yield Surface in a Single Test |
| Author(s) |
Syed Idrees A. Jalali, Yakov Zelickman, Anchen Tong, John Sharon, Jamie Guest, Kevin J Hemker |
| On-Site Speaker (Planned) |
Syed Idrees A. Jalali |
| Abstract Scope |
We review a suite of advanced high-throughput specimen designs and testing strategies that redefine conventional approaches to material characterization. Using topology optimization (TO), we identified geometrical gage sections capable of generating multiple stress states within a single specimen. This allows for the extraction of multiple yield points and the creation of a yield surface with a single test. To ensure high data fidelity, control stress localization, and produce interpretable deformation histories at different points in the specimen, we refined the designs using finite element modeling (FEM) and digital image correlation (DIC). This enables accurate stress–strain curve acquisition across targeted and variable stress states. Notably, the method also captures strain hardening behavior for local instantiations and load paths. The outcome is a data-rich testing platform that significantly accelerates materials evaluation. These innovations provide a framework for rapid material assessment, paving the way for faster discovery and development of advanced materials. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Mechanical Properties, Other, Other |