About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
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| Presentation Title |
Towards Interfacing Dark-Field X-Ray Microscopy to Dislocation Dynamics Modeling |
| Author(s) |
Nils Axel Henningsson, Sina Borgi, Grethe Winther, Anter El-Azab, Henning Friis Poulsen |
| On-Site Speaker (Planned) |
Nils Axel Henningsson |
| Abstract Scope |
We present theoretical developments toward reconstructing full 3D deformation gradient tensor fields from Dark-Field X-ray Microscopy (DFXM) data. Exploiting the unique capabilities of DFXM, the approach enables in situ, non-destructive imaging of deformation fields within deeply embedded crystalline regions. The proposed regression framework, based on the kinematic diffraction approximation, is tailored for tracking microstructural evolution during plastic deformation. We derive the conditions under which diffraction vectors can be uniquely mapped to the underlying deformation gradient tensor field and show that accurate reconstruction requires limited higher-order spatial variation along the diffracted X-ray path. From the reconstructed elastic distortion field, local dislocation densities are computed via its curl, enabling localization of dislocation cores and extraction of associated Burgers vectors. We argue that this measurement modality offers a critical pathway for validating and informing dislocation dynamics models. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Other |