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Meeting 2026 TMS Annual Meeting & Exhibition
Symposium Advanced Real Time Imaging for Materials Science and Processing
Presentation Title Pulsed resolved X-ray imaging for characterization of ultrafast processes
Author(s) Patrik Vagovic, Jayanath Koliyadu, Tokushi Sato, Kim Chan, Vid Angež, Claus-Dieter Ohl, Manolis Gavaises, Patricia Pfeiffer, Jozef Ulicny, Daniel Mosko, Peter Szeles, Mohammad Shahsavari, Richard Bean, Daniel Eakins, Libor Juha, Tomas Burian , Zuzana Kuglerova, Alke Meents, Alke Meents, Jayanath Koliyadu
On-Site Speaker (Planned) Patrik Vagovic
Abstract Scope The pulse synchronized X-ray imaging at the sources of 4th generation such as synchrotrons and XFEL’s offers unique opportunities for characterization of ultra-fast processes in materials or biological systems. Among XFEL sources European XFEL provide intense hard X-ray pulses at megahertz repetition rate. To utilize the unique pulse repetition rate of European XFEL we have proposed and demonstrated MHz X-ray microscopy accessible via standard user proposals. We furthermore patented MHz X-ray Tomoscopy method, which extract from the primary beam several beamlets, by utilizing HPHT diamond Bragg splitters, which are then passing through the common point where the sample is placed. Multiple MHz X-ray detectors downstream each beamlet, are recording sequences of pulsed synchronized X-ray videos. I will present recent successful validation results which open up new possibilities for imaging of ultrafast phenomena
Proceedings Inclusion? Planned:
Keywords Characterization, Other,

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Multimodal Operando/In Situ Characterizations of Dynamic Surface Reactions of Metals and Alloys
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