About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
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Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
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| Presentation Title |
Orientation-Adaptive Virtual Imaging of Defects Using EBSD |
| Author(s) |
Nicolo Della Ventura, James Lamb, William Lenthe, McLean Echlin, Julia Puerstl, Emily Trageser, Alejandro Quevedo, Matthew Begley, Tresa Pollock, Daniel Gianola, Marc De Graef |
| On-Site Speaker (Planned) |
Nicolo Della Ventura |
| Abstract Scope |
Recent advances in electron backscatter diffraction (EBSD) enabled by direct electron detectors have opened new pathways for high-sensitivity, orientation-resolved imaging of crystal defects. In this talk, we present a novel framework, Orientation-Adaptive Virtual Apertures (OAVA), that leverages the full diffraction space captured in EBSD maps to visualize dislocations with different diffraction conditions. By aligning virtual apertures dynamically in reciprocal space according to local orientation, OAVA enhances diffraction contrast from defect-induced strain in a manner akin to TEM, yet without requiring sample tilting, and entirely achieved through post-processing. Using EBSD datasets acquired with direct detectors at low voltages, we demonstrate consistent diffraction imaging of dislocations in polycrystalline Ni and single-crystal GaN. Automated analysis algorithms enable large-area defect mapping, while contrast analysis across diffraction conditions supports Burgers vector identification. These developments position EBSD, combined with direct detectors and OAVA, as a high-throughput, orientation-specific tool for defect characterization at sub-micron resolution. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |