About this Abstract |
| Meeting |
Materials in Nuclear Energy Systems (MiNES) 2025
|
| Symposium
|
Materials in Nuclear Energy Systems (MiNES) 2025
|
| Presentation Title |
Ion Irradiation Effects in Wrought FeCrAl, Additively Manufactured ODS FeCrAl and Conventional Powder Metallurgy ODS FeCrAl |
| Author(s) |
Thomas Siggillino, Steven Zinkle, Caleb Massey |
| On-Site Speaker (Planned) |
Thomas Siggillino |
| Abstract Scope |
FeCrAl alloys are being explored as a more radiation resistant and accident tolerant alternative to Zr-based alloys in nuclear reactor fuel cladding, with even greater radiation resistance achieved by adding oxide dispersoids to FeCrAl to produce oxide dispersion strengthened (ODS) variants. Additive manufacturing with in-situ oxide precipitation has been explored to improve the flexibility and cost of ODS FeCrAl. However, data is currently lacking on the response of additively manufactured ODS FeCrAl to ion irradiation. In this work, a comparison is made between wrought FeCrAl, FeCrAl with dissolved Y additively manufactured using directed energy deposition in an oxygen environment to produce Y-rich oxide precipitates, and a powder metallurgy ODS FeCrAl alloy extruded at 1000°C. All three materials were irradiated with 10 MeV Cu3+ ions at 300°C to a midrange dose of 10 dpa at a dose rate of 3×10-4 dpa/s. The ion irradiated samples were characterized with nanoindentation using the Nix-Gao model to estimate the relative increases in bulk equivalent hardness. The wrought FeCrAl, DED FeCrAl, and powder metallurgy ODS FeCrAl showed hardness increases of 1.54 GPa, 1.12 GPa, and 0.93 GPa respectively in the irradiated versus unirradiated regions of each sample. STEM characterization was performed to determine the dislocation loop average size and density in each microstructure as well as to observe the response of the oxide dispersoids to ion irradiation. EDS was performed during STEM characterization to confirm the range of the implanted Cu ions in comparison to SRIM predictions and to avoid potential implanted ion artifacts. |
| Proceedings Inclusion? |
Undecided |