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Late News Poster Session: Nanostructured Materials
Program Organizers: TMS Administration

Monday 5:30 PM
March 20, 2023
Room: Exhibit Hall G
Location: SDCC

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Ultra-fast 4D-STEM Detector for Rapid Nanoscale Strain/Phase Mapping: Kalani Moore¹; ¹Direct Electron
     4D-STEM allows nanoscale regions of a material to be mapped out according to their strain or different phases. The technique has applications in failure analysis and the design of novel heterostructures, where interfacial strain can destroy device performance. 4D-STEM was previously limited by the slow framerates of optically-coupled cameras but direct detectors have recently enabled an increase in speed by two orders of magnitude. Celeritas XS is a new direct detector from Direct Electron. It is specially designed to enable ultrafast acquisition of 4D-STEM data so that results can be delivered to the user in real time. With 1k x 1k pixels, Celeritas XS has the added flexibilty of being useful for traditional TEM imaging. Here we present 4D STEM mapping of long range ordering in organic glass samples with different cooling rates.

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