Materials Informatics for Images and Multi-dimensional Datasets: Session II
Sponsored by: ACerS Basic Science Division, ACerS Electronics Division
Program Organizers: Amanda Krause, Carnegie Mellon University; Alp Sehirlioglu, Case Western Reserve University; Daniel Ruscitto, General Electric
Wednesday 2:00 PM
October 20, 2021
Room: A124
Location: Greater Columbus Convention Center
Session Chair: Amanda Krause, University of Florida; Kimberly Gliebe, Case Western Reserve University
2:00 PM
Characterization of Additively Manufactured ZrB2-SiC Ultra High Temperature Ceramics via X-ray Microtomography: Pratish Rao1; Jonghyun Park1; Jeremy Watts1; William Fahrenholtz1; Gregory Hilmas1; David Lipke1; 1Missouri University of Science and Technology
Additively manufactured (AM) zirconium diboride-silicon carbide (ZrB2-SiC) composites are being considered as potential Brayton Cycle based heat exchangers materials, with supercritical CO2 as the working fluid, operating at temperatures as high as 1100 oC and pressures up to 250 bar. An extensive understanding of microstructure is thus critical in refining the processing parameters, resulting in fabrication of the components with long term durability. X-ray micro-computed tomography has been employed to quantitatively study the microstructural features of ZrB2-SiC systems. In this research, X-ray microtomography imaging was employed as a nondestructive characterization technique to analyze the microstructural aspects of the additively manufactured ceramic components. Statistical analysis was performed on 2D microtomographic projections of ZrB2-SiC (70-30 vol.%) sintered bodies to understand the interplay between processing parameters and the ensuing microstructure. The analysis of X-ray microtomography provided information on pore sizes and distribution, geometry and the allowable tolerances for longstanding durability under thermomechanical loading.
2:20 PM
Now On-Demand Only - Computational or Experimental? Interpreting X-ray Absorption and Diffraction Contrast for Massive Non-destructive 3D Grain Mapping of Metals in Laboratory CT: Andy Holwell1; Hrishi Bale2; 1Carl Zeiss Microscopy Ltd.; 2Carl Zeiss Microscopy Inc.
Laboratory 3D X-ray microscopy (XRM) has previously been limited to imaging via material density differences within the sample. As such, single-phase polycrystalline materials (e.g. alloys) do not exhibit any absorption contrast to reveal the underlying grain microstructure. For microstructural crystallography, researchers have turned to time-consuming 3D electron backscatter diffraction in the scanning electron microscope in metallurgy, ceramics, semiconductors, pharmaceuticals, geology etc. Now, laboratory-based diffraction contrast tomography (DCT) can extract crystallographic information from single-phase polycrystalline samples, non-destructively and in three dimensions. DCT scans collect x-ray diffraction patterns which are deconvoluted for crystallographic reconstruction. Information on grain morphology, orientation, size and centroid position is available from the reconstructed 3D grain map, for studies of grain growth, tensile testing and aniostropy, delivering explicit grain structures for modeling.We show how LabDCT provides a routine solution for experimentally acquiring explicit 3D grain structures in various materials, enabling direct coupling of experimental results and simulations.