Grain Boundaries, Interfaces, and Surfaces in Ceramics: Fundamental Structure—Property—Performance Relationships: Poster Session
Sponsored by: ACerS Basic Science Division, ACerS Electronics Division
Program Organizers: Rheinheimer Wolfgang, Forschungszentrum Jülich; Catherine Bishop, University of Canterbury; Shen Dillon, University of California, Irvine; Ming Tang, Rice University; John Blendell, Purdue University; Wayne Kaplan, Technion - Israel Institute of Technology; Melissa Santala, Oregon State University
Tuesday 11:00 AM
October 19, 2021
Room: Exhibit Hall B
Location: Greater Columbus Convention Center
Poster
P1-20: A Novel Probe for Grain Boundary Characterization on the Mesoscopic Scale: Lab-based Diffraction Contrast Tomography: Jun Sun1; Jette Oddershede1; Hrishikesh Bale2; Florian Bachmann1; William Harris3; Erik Lauridsen1; 1Xnovo Technology; 2Carl Zeiss X-ray Microscopy; 3Carl Zeiss Microscopy, LLC
The grain boundary characters are essential information to analyze grain boundary related behaviors such as preferential precipitation or intergranular cracking in polycrystalline materials. Accessing the necessary parameters to describe a grain boundary on the mesoscopic scale is beyond the reach of 2D characterization techniques and is only achievable through a 3D approach. With the capability to map the grain morphology and crystallographic orientation non-destructively in 3D, lab-based diffraction contrast tomography (DCT) using X-rays provides the necessary information to analyze the crystallographic parameters describing grain boundaries on the mesoscopic scale, including grain boundary misorientation angle/axis and plane inclination. In this work, we will present the results of using lab-based DCT to investigate the grain boundary characters in polycrystalline materials including ceramic examples, with further discussion of how the grain boundary properties are related to grain boundary behaviors such as grain boundary wetting and cracking.
P1-21: The Effect of High Energy Diffraction Microscopy (HEDM) and Laboratory Diffraction Contrast Tomography (LabDCT) Resolution on Measured Grain Growth Parameters in Strontium Titanate (SrTiO3).: Vivekanand Muralikrishnan1; Jette Oddershede2; He Liu3; Bryan Conry1; Florian Bachmann2; Robert Suter3; Amanda Krause1; 1University of Florida; 2Xnovo Technology ApS; 3Carnegie Melon University
Non-destructive 3D x-ray diffraction microscopy (3DXRD) techniques provide an opportunity to track how individual grains and grain boundaries in a microstructure evolve over time to explore poorly understood grain growth phenomena. However, these 3D techniques have limited spatial resolution, which can impact the accuracy of the measured grain growth parameters. This study evaluates how differences in spatial resolution between easily accessible Laboratory-based Diffraction Contrast Tomography (LabDCT) (3µm) and limited access synchrotron-based High Energy X-Ray Diffraction Microscopy (HEDM) (2µm) impact the grain growth parameters, including grain size and grain boundary curvature. While differences in grain boundary location can affect parameters like curvature, we found that the general correlation between the grain growth parameters is similar in LabDCT and HEDM when statistically observed for all the grains in the microstructure. The implication of these results and the benefits and limitations of these techniques will be discussed.