||Additive Manufacturing (AM) is moving quickly from the test laboratory environments to the manufacturing facilities. As a production technology, AM must meet stringent requirements concerning material quality, process reliability and reproducibility. In fact, AM offers a unique opportunity for in-situ process control since products are built layer by layer, giving full access to inner sections of the built material.
The purpose of this symposium is to review and discuss various technologies and applications involving in-situ process monitoring and control. We welcome papers exploring existing solutions on commercial AM equipment, as well as new innovative methods which are still at a laboratory stage.
Suitable topics for this symposium include, but are not limited to, in-situ methods for:
- Monitoring of powder layer quality
- Detection of porosity and other defects
- In-process defect repair
- Monitoring of dimensional accuracy (XY) and surface topography (Z)
- Thermal monitoring and mapping
- Real-time melt pool characterization
- Evaporation loss measurement
- Monitoring of vacuum quality, process gas purity and gas flow pattern
- High-speed imaging of fast processes such as powder distribution, melt pool dynamics, spattering and electrostatic levitation
- Monitoring of beam quality (laser or electron beam)
- Detection of acoustic signals, X-rays, backscatter electrons and other innovative methods to extract process quality information or to confirm reliability of the AM machine.