||Shadia Jamil Ikhmayies, Al Isra University
Bowen Li, Michigan Technological University
John S Carpenter, Los Alamos National Laboratory
Jian Li, CanmetMATERIALS
Jiann-Yang Hwang, Michigan Technological University
Sergio Neves Monteiro, Military Institute of Engineering
Firrao Donato, Collegio Universitario, Italy
Mingming Zhang, ArcelorMittal Global R&D
Zhiwei Peng, Central South University
Juan P. Escobedo-Diaz, UNSW Australia
Chenguang Bai, Chongqing University
Eren Yunus Kalay, METU
Ramasis Goswami, Naval Research Laboratory
Jeongguk Kim, Korea Railroad Research Institute
||The symposium focuses on the characterization of the minerals, metals and materials and the applications of characterization results on the processing of these materials. Subjects include, but are not limited to, extraction & processing of various minerals, metals (including ferrous, non-ferrous and precious metals and alloys, etc), metal matrix composites, glass, ceramic and refractories, polymers, fiber materials, biomaterials, carbon, electronic, magnetic and optical materials, high-temperature materials, newly developed advanced materials, gaseous, liquid and solid pollutants, recycling, insulation materials, and advanced characterization techniques, etc.
Areas of interest include, but are not limited to:
- Techniques for characterizing materials across a spectrum of systems and processes
- Characterization of mechanical, electrical, electronic, optical, dielectric, magnetic, physical and chemical properties of materials
- Characterization of processing of materials
- Characterization of structural, morphological and Topographical properties of materials
- Emerging characterization techniques
- Characterization of extraction and processing, which include process development and analysis of various processes.
- Characterization of microstructure and properties of materials, which include: process integration, characterization of thin and thick films (semi-conductor), micro-texture, computer tomography (CT), X-ray tomography (XRT),in-situ microscopy, nano-scale TEM, AFM, FIB techniques, and GeoMet, etc.
This symposium encourages, but does not demand, accompanying proceedings papers for each oral presentation. Awards are presented for individuals who provide the best combination of oral presentation and written proceedings paper. In addition, a poster session will occur at TMS 2017 with an award for best poster.