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Meeting 2015 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Coherent Imaging
Sponsorship TMS Extraction and Processing Division
TMS: Materials Characterization Committee
Organizer(s) Ross Harder, Argonne National Lab
Richard Sandberg, Los Alamos National Laboratory
Brian Abbey, La Trobe University
Xianghui Xiao, Argonne National Laboratory
John Carpenter, Los Alamos National Laboratory
Scope Objective: This symposium will provide a venue for presentations regarding the use of coherent diffraction imaging techniques (x-ray and electron diffraction imaging, ptychography, holography) and phase contrast imaging techniques for high resolution characterization in all classes of materials.

Background and Rationale:
A high degree of spatial coherence is an attractive property in x-ray and electron beams. Those from modern synchrotrons and electron microscopes have enabled the development of novel imaging methods. In some cases these imaging methods provide resolution beyond that achieved with optics (<10nm) and can also provide remarkable sensitivity to a variety of contrast mechanisms.
The two methods that will be the focus of this symposium are coherent diffractive imaging (CDI) and phase contrast imaging (PCI). Both explicitly take advantage of the coherence properties of the incident beams. CDI has rapidly advanced in the last fifteen years to allow characterization of a broad range of materials, including nanoparticles, strained crystals, biomaterials and cells. PCI has been widely employed in dynamics and engineering studies of materials, geophysics, medicine and biology. Various techniques making use of both x-rays and electrons have been developed that provide unique characterization abilities such as three dimensional strain mapping and non-destructive three dimensional tomographic imaging.

Areas of interest include, but are not limited to:
(1) All x-ray based techniques including Bragg CDI, Fresnel CDI, ptychographic CDI, propagation phase contrast imaging, interferometry imaging, and analyzer based phase-contrast imaging
(2) All electron based techniques including ptychography and electron CDI
(3) All structural and functional materials systems
(4) Industrial applications
(5) Development of new techniques and new sources
Abstracts Due 07/15/2014
Proceedings Plan Planned: A print-only volume

A Perfect Storm: Nanoscale Imaging of Materials with Coherent X-rays
Bragg Coherent Diffraction Imaging of Dynamics at the Nano- and Meso-Scale
Coherent Diffractive Imaging Applied to Materials Characterisation at Multiple Lengthscales
Coherent Imaging in Reflection and Transmission Modes Near the Wavelength Limit Using Tabletop High Harmonics
Coherent X-ray Diffractive Imaging for Materials Characterization: Possibilities and Challenges
Determination of the Phase Domain Distribution in Single Semiconductor Nanowires by Means of Coherent Diffraction Imaging
Fast X-ray Tomography Applications in Material Sciences with Phase-Contrast Imaging
High-Resolution Quantitative Imaging of Functional Materials with Coherent X-ray Diffraction Microscopy
Holography Using an Arbitrary Reference Wave
In-Situ X-ray Imaging of Microstructural Evolution in Metallic Alloys during Directional Solidification
In Situ Investigation of Dynamic Material Response Using Synchrotron-based Propagation Phase Contrast Imaging
In Situ Investigation of Stress Corrosion Cracking of Aluminum Alloys by X-ray Synchrotron Tomography
In Situ Nano-Mechanical Testing in Combination with Coherent Bragg X-Ray Diffraction Imaging
Integrated Solution for Quantification of Filamentous Material in 3D Imaging
Magnetic Memory in Ferromagnetic CoPd IrMn Films Studied by Coherent X-ray Magnetic Scattering Correlation Spectroscopy
Nano-Imaging with Ptychography
Nanobeam Ptychography of Integrated Circuits
Observing Nanoscale Magnetostriction with Coherent X- rays in DC and Pulsed Magnetic Fields
Phase Contrast In-situ X-ray Tomographic Imaging for Materials Science
Soft-X-ray Holographic Imaging of Magnetic Nanostructures
Three-Dimensional Atomic Resolution Tomography Reconstruction of Tilt Series
Three-Dimensional Bragg Coherent Diffractive Imaging Using Polychromatic X-rays
Ultrafast Imaging of Shocked Material Dynamics with X-ray Fee Electron Laser Pulses
Watching Microstructure Evolve Using Phase Contrast X-ray Imaging

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