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Meeting Materials Science & Technology 2016
Symposium Symposium on Applications of Low Emittance Synchrotron X-ray Sources to Mesoscale Materials Studies
Sponsorship
Organizer(s) Robert M Suter, Carnegie Mellon University
Dean Haeffner, Argonne National Laboratory
Scope Numerous synchrotron radiation facilities around the world are implementing or have proposed plans to implement multi-bend achromat (MBA) magnetic lattices that will yield far higher x-ray brightness and coherence than current sources. These new sources have the potential to revolutionize meso-scale studies of materials behaviors, properties, and responses. Current micron resolution measurements will be accelerated by the increased brightness that will allow more detailed studies as samples are incrementally loaded by external forces, temperatures, or other fields. The coherence properties of the new beams will facilitate complementary lensless diffraction imaging with spatial resolution at the 10 - 50 nm length scales. Furthermore, the added coherence at high energies will allow measurements such as Coherent Diffraction Imaging and Ptychography, that are currently only practical using ~ 8 keV x-rays, to be carried out at substantially higher energies. This will allow coherent diffraction measurements to probe internal structures and evolution inside bulk samples. The combination of micron and nanometer measurements promises to allow studies that track responses from defect to macroscopic length scales and thus lend themselves to the development of multi-scale models with predictive character.

We solicit papers that discuss on-going and/or proposed work that would benefit from the capabilities of the new sources. Novel approaches to comparing micron and sub-micron resolution data sets to computational materials models are also solicited.
Abstracts Due 03/31/2016
Proceedings Plan Definite: MS&T all conference proceedings CD
PRESENTATIONS APPROVED FOR THIS SYMPOSIUM INCLUDE

A Deep, Coherent View of Integrated Circuits: Fast X-ray Ptychography to See Nanoscale Detail without Wafer Thinning
A High-energy Microscope at the Upgraded Advanced Photon Source
Coherent Diffractive Imaging of Defect Dynamics in Nanoparticles
Combining Experiment and Simulation for the Characterization of Semiconducting Heterostructures Using Coherent X-ray Nanodiffraction
In-situ X-ray Scattering Studies of Mesoporous Materials under Extreme Conditions
Multiscale Movies of Microstructure Evolution
Opportunities for Materials Science with New 3D Bragg Ptychography Methods.
Physical Thermo-mechanical Simulation in a Synchrotron Beam: The Materials Oscilloscope
Process and Performance Control at the Mesoscale and the MaRIE Project
Revolutions in Coherent X-ray Sources Will Enable Dynamic Nanometer Scale Strain Imaging in Structural Materials
Scalable Manufacturing Processes for X-Ray Optics
Understanding the Performance of Structural Materials using High Energy X-rays
“Routine” Hard X-ray Imaging at the Deep Nanoscale


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