||Numerous synchrotron radiation facilities around the world are implementing or have proposed plans to implement multi-bend achromat (MBA) magnetic lattices that will yield far higher x-ray brightness and coherence than current sources. These new sources have the potential to revolutionize meso-scale studies of materials behaviors, properties, and responses. Current micron resolution measurements will be accelerated by the increased brightness that will allow more detailed studies as samples are incrementally loaded by external forces, temperatures, or other fields. The coherence properties of the new beams will facilitate complementary lensless diffraction imaging with spatial resolution at the 10 - 50 nm length scales. Furthermore, the added coherence at high energies will allow measurements such as Coherent Diffraction Imaging and Ptychography, that are currently only practical using ~ 8 keV x-rays, to be carried out at substantially higher energies. This will allow coherent diffraction measurements to probe internal structures and evolution inside bulk samples. The combination of micron and nanometer measurements promises to allow studies that track responses from defect to macroscopic length scales and thus lend themselves to the development of multi-scale models with predictive character.
We solicit papers that discuss on-going and/or proposed work that would benefit from the capabilities of the new sources. Novel approaches to comparing micron and sub-micron resolution data sets to computational materials models are also solicited.