|About this Symposium
||2020 TMS Annual Meeting & Exhibition
||Additive Manufacturing: In-situ Diagnostics and Techniques
||Tom James Stockman, Los Alamos National Laboratory
Joy Gockel, Write State University
Timothy Joseph Horn, North Carolina State University
Sneha Prabha Narra, Worcester Polytechnic Institute
Judy Schneider, University of Alabama in Huntsville
||As additive manufacturing (AM) is adopted into increasingly demanding applications, a rigorous understanding of processing variations and the methods for quality assurance must also advance. Strenuous application environments create a need for a deep understanding of the AM process and material quality. In AM, the material is built at the same time as the component. This establishes the need for techniques which can help identify and understand the formation of inherent defects and process anomalies during fabrication.
In-situ techniques are increasingly advancing to meet this demand. Laboratory scale in-situ measurements can provide great insight into the complicated phenomena occurring in AM, and in-situ signatures are being identified which can locate, and potentially eliminate, defects and other anomalies in AM parts.
The purpose of this symposium is to review and discuss existing and emerging in-situ technologies used to expose process phenomenon, detect material quality, and control process variation. Applicable topics for this symposium include in-situ monitoring and control techniques from laboratory scale research to industrial-scale implementation.