| About this Symposium |
| Meeting |
2010 TMS Annual Meeting & Exhibition
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| Symposium
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Solid-State Interfaces: Toward an Atomistic-Scale Understanding of Structure, Properties, and Behavior through Theory and Experiment
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| Sponsorship |
The Minerals, Metals and Materials Society
TMS Electronic, Magnetic, and Photonic Materials Division
TMS Structural Materials Division
TMS: Chemistry and Physics of Materials Committee
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| Organizer(s) |
Michael Demkowicz, Massachusetts Institute of Technology
Douglas Medlin, Sandia National Laboratories
Emmanuelle Marquis, University of Oxford |
| Scope |
The range of atomic-level configurations exhibited by interfaces in materials far exceeds that found in the crystals between which they form. For instance, in both single-phase and heterophase materials, atoms at interfaces may be arranged into arrays of intrinsic defects, interface-specific phases or “complexions,” and amorphous layers. Understanding the full intricacy of interfacial structure, the mechanisms governing its evolution, and its connection to interfacial behavior poses a long-standing problem. Current advances in atomic-scale modeling and atomic-resolution microscopies, however, are providing new insights into the full three-dimensional and temporal character of interfaces and are beginning to establish the links between atomic scale structure, composition, and behavior.
This symposium will examine advances in understanding the detailed atomic-level structure and composition of interfaces and its connections to behaviors such as mass and heat transport, microstructural evolution and stability, mechanical response, and chemical reactivity. Studies that aim to investigate the atomic-scale constitution of interfaces by both modeling and experimental means will be presented. Additionally, efforts to incorporate knowledge of atomic-level structure and properties of interfaces into mechanistically-informed design of materials will be reviewed.
Confirmed invited speakers for this symposium are:
J. W. Cahn (National Institute of Standards and Technology)
W. D. Kaplan (Technion)
C. Colliex (CNRS, Universite Paris Sud)
N. A. Mara (Los Alamos National Laboratory)
P. M. Derlet (Paul Scherrer Institut)
X. Zhang (Texas A&M University)
Y. Mishin (George Mason University)
D. G. Cahill (University of Illinois--Urbana-Champaign)
S. Aubry (Stanford)
S. Foiles (Sandia National Laboratories)
C. Schuh (MIT)
D. Seidman (Northwestern University)
U. Dahmen (Lawrence Berkeley National Laboratory) |
| Abstracts Due |
08/03/2009 |
| Proceedings Plan |
Definite: A CD-only volume |