|About this Symposium
||Materials Science & Technology 2016
||Advancements in In-situ Electron Microscopy Characterization
||Khalid Hattar, Sandia National Laboratories
Josh Kacher, Georgia Tech
Daniel S Gianola, University of California, Santa Barbara
Judith C Yang, University of Pittsburgh
Amith D Darbal, AppFive LLC
||This symposium will provide a venue for presentations investigating the microstructural stability of structural materials in extreme environments via the application of advanced in-situ, analytical, and automated orientation mapping techniques.
Background and Rationale: Recent advances in in-situ electron microscopy techniques have expanded the experimental parameter space to permit a deeper characterization of materials at the micrometer and nanoscale during a range of thermal, mechanical, or chemical loading conditions and in a wide range of environments. It is now possible using in-situ TEM and SEM to directly observe and characterize the mechanical and thermal stability of nanostructured materials as well as deformation modes of structural materials in both ambient and extreme environments. This includes in-operando electron microscopy, a new but rapidly growing field of techniques in which the direct spectroscopic characterization of materials is collected simultaneously with chemical reactivity measurements. The major emphasis of this symposium will be the use of these recently developed techniques to understand the microstructural stability, especially grain boundary stability, of structural materials exposed to extreme environments. Talks of this nature are often scattered across symposia at MS&T and this new gathering would provide a place to talk about new advances in in-situ and in-operando electron microscopy techniques and their application to a variety of material systems.
Areas of interest include, but are not limited to: (1) Development of new SEM and TEM capabilities (2) Research in extreme environments including but not limited to: gas, liquid, and radiation environments, as well as thermal and mechanical loading (3) Combination of analytical and in-situ SEM and TEM techniques applied to structural materials (4) Combination of automated phase and orientation mapping to microstructure characterization and in-situ SEM and TEM techniques applied to various material systems (5) Overlapping of two or more in-situ SEM and TEM techniques applied to structural materials (6) The application of insights gained through advanced in-situ electron microscopy experiments to the development of computational models.
||Definite: MS&T all conference proceedings CD