||Characterization of materials from atomic to bulk has become imperative to understand the nuances on the different properties of smart, functional materials. This could involve electron microscopy techniques (eg. SEM, TEM, EDS, EPMA etc) to understand the microstructure of the materials, spectroscopic techniques (eg EELS, XAS, XPS etc) to understand local geometry and/or electronic structure, diffraction techniques (eg. XRD, SAXS etc) to understand the structure of bulk materials. The characterization can also involve electro-chemical techniques to understand novel catalyst or energy materials.
The scope of this symposium will be directed mostly to understand a unique observed material property (could be mechanical, electrical, optical, electro-chemical etc). Different bulk materials characterization techniques can be used to probe fundamentally the origin of such properties and thereby use this as a lever to fine-tune or modify the observed property.
This symposium generated a lot of interest in the materials science and materials characterization community. Over 75 abstracts were submitted for MS&T 2015.