||Sudarsanam S. Babu, The Ohio State University
Eliot D Specht, Oak Ridge National Laboratory
Neal D Evans, The University of Tennessee
Yu U Wang, Michigan Technological University
Thomas Kannengiesser, BAM Federal Institute of Materials Research and Testing
Yu-Ichi Komizo, Osaka University
Antonio J Ramirez, Brazilian Synchrotron Light Laboratory - CNPEM/ABTLuS
||The characterization of dynamic or transitory properties of parent and product phases during phase transformations remains an ongoing challenge to materials scientists. These properties of interest include lattice structure, chemistry, morphology, thermal and mechanical characteristics. Historically, these were investigated by many ex-situ techniques and interpretation of the results using multi-scale computational models. However, there is both growing interest and growing capability to monitor such transformations in place, as they are occurring, that is in-situ, in order to validate predicted transformation paths and transformation rates.
A new generation of in-situ characterization techniques, employing neutron and synchrotron- beam lines, now makes possible the interrogation of phase transformations under transient thermal, mechanical, electro-magnetic field, and chemical stimuli. These techniques provide unprecedented spatial (sub-micron) and time (sub-second) resolutions. Moreover, the user facilities that offer these beam-lines have started incorporating auxiliary instrumentation to allow for simultaneous measurements using other techniques as well. Furthermore, developments in electron microscopy in-situ techniques and capabilities allow for direct observation of phase transformations at even higher spatial and time resolutions.
This symposium solicits contributions from students, researchers, and scientists who develop and use in-situ techniques for materials science investigations. In addition to regarding phase transformations in steels, aluminum, nickel, titanium and other structural alloys, materials systems of interest include ceramics, semiconductors and insulators. Materials issues include but are not limited to oxidation, gas reactions, radiation effects, temperature/stress/field induced phase transformations, catalysis, electrical properties, tensile and mechanical properties. Results from studies involving both mature techniques and those recently developed are sought.