| About this Conference |
| Meeting |
13th International Conference on Defects--Recognition, Imaging and Physics in Semiconductors |
| Dates |
09/13/2009 - 09/17/2009 |
| Location |
Wheeling, WV, USA |
| Scope |
For more than 20 years, the DRIP conference has filled a unique niches in the physics of semiconductor defects, focusing on all aspects, including point, line, planar and volume defects studied by a variety of techniques. |
| Conference
Chair |
Marek Skowronski, Carnegie Mellon University
Robert Stahlbush, Naval Research Laboratory
Michael Dudley, State University of New York at Stony Brook
|
| Meeting
Home Page |
http://www.tms.org/Meetings/Specialty/drip09/home.html |