|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||Materials Characterisation via Optical Ptychographic Imaging: Principles and Applications
||Guido Cadenazzi, Nick Anthony, Eugeniu Balaur, Keith Nugent, Brian Abbey
|On-Site Speaker (Planned)
Over the past decade ptychography has become a well established technique within the x-ray community. It can deliver quantitative phase images, over a large field of view, without suffering the deleterious effects of lens aberrations. Nevertheless, its application to visible wavelengths offers a number of potential benefits. In particular, visible light is ideally suited to studying biological samples which are often weakly scattering and prone to radiation damage. Optical ptychography is also well-suited to characterising the material properties, such as stress, of optically transparent anisotropic samples, where x-ray analysis is can be difficult to apply. With this in mind we describe the development and operation of a flexible, optical ptychographic microscope with broad applications spanning biological samples, nano-materials and stress/strain imaging. We discuss the key considerations involved in designing such a system and demonstrate the various imaging modalities it can perform and opportunities that exist for materials characterisation.
||Planned: Supplemental Proceedings volume