|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Hume-Rothery Award Symposium: Alloy Phase Chemistry at the Atomic Level - Opportunities and Challenges
||Revisiting Field Ion Microscopy
||Baptiste Gault, Michal Dagan, Shyam Katnagallu, Frédéric De Geuser, François Vurpillot, Dierk Raabe, Michael P. Moody
|On-Site Speaker (Planned)
Atomic-scale microscopy and microanalysis fundamentally drive advances in basic and applied materials science, allowing for correlating materials and devices properties to their atomic structure and chemical composition. Atom probe tomography (APT) has risen in prominence over the past decades owing to its unique capacity for nanoscale characterisation of structural and functional materials. APT has stemmed from field ion microscopy (FIM), the first technique to enable the imaging of individual atoms as early as the 1950s. However, FIM is currently only rarely performed despite its true complementarity with APT.
In this presentation, we will present a quick tour of what FIM has to bring to APT, from the fundamental aspects of the projection to advancing the understanding of atoms at the specimen surface under high electric field conditions, and, finally, full three-dimensional reconstruction, with true atomic resolution, of the crystalline lattice as well as structural defects.
||Planned: Supplemental Proceedings volume