|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||Characterization of Defects in Metal Oxide Thin Films Using Electron Channeling Contrast Imaging (ECCI) and TEM
||Isha Kashyap, Marc De Graef
|On-Site Speaker (Planned)
Metal oxide thin films exhibit interesting high temperature properties. La<SUB>1-x</SUB>Sr<SUB>x</SUB>MnO<SUB>3</SUB> (LSM) is well known for its application as a cathode material in Solid Oxide Fuel Cells (SOFC). LSM is also ferromagnetic and exhibits Colossal Magneto Resistance (CMR). The lattice mismatch between thin film and substrate creates a misfit strain which produces a host of extended defects. Quantifying these defects and their displacement vectors within a material is important for understanding how defects can affect the material properties, in particular the magnetic and electrical properties. In this study, we employ Electron Channeling Contrast Imaging (ECCI), an SEM-based non-destructive technique, to characterize, quantitatively, various kinds of defects including APBs, dislocations and twin boundaries in LSM and other oxide thin films. We also analyze the magnetic microstructure using Lorentz TEM, and compare these results with data acquired from ECCI to understand the interactions between magnetic domain walls and crystallographic defects.
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