|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Rare Metal Extraction & Processing
||Thermodynamic Study of Ga Extraction for Trace Element Analysis by ICP-MS
||Kyungjean Min, David Johnson, Kevin Trumble
|On-Site Speaker (Planned)
Inductively Coupled Plasma Mass Spectrometry (ICP-MS) has a detection limit of sub parts per trillion (ppt) level. However, it was found the detection limit increased to ~10 ppb for the analysis of impurities in ultra-pure Ga of 7N (99.99999%) and 8N (99.999999%) by ICP-MS due to matrix-induced interference. To reduce matrix-induced interference and achieve lower detection limit, Ga was extracted using Sephadex G-25 (dextran-based resin) during sample preparation. Sephadex G-25 can chemically separate Ga from impurities such as Ge and Zn based on adsorption chromatography, with the different extraction degrees depending on pH. Separated percentages of impurities and Ga relative to initial concentrations of impurities and Ga before separation were obtained under optimized pH range and the degree of reduced matrix-induced interference by Ga separation in the measurement of ICP-MS was evaluated.