|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Driving Discovery: Integration of Multi-Modal Imaging and Data Analysis
||In Situ Synchrotron Quantification of Evolving Solidification Microstructures in Ni and Co Based Alloys
||Mohammed Abdul Azeem, Peter D Lee, Peter Rockett, Loic Courtois, Shyamprasad Karagadde, Fenglin Yi, Rahman Khandaker, David Dye, Robert Atwood
|On-Site Speaker (Planned)
||Mohammed Abdul Azeem
Understanding the microstructural evolution of Ni and Co superalloys during solidification is essential for not only the control of final properties, but also for the elimination of defects such as shrinkage porosity and freckles.
In this investigation, grain, dendrite and defect morphology is quantified during solidification in 4D (3D + time) using synchrotron x-ray tomography. Two novel high x-ray attenuation contrast alloys, (Ni,Co) Hf , were developed to allow tomographic quantification. Statistical measures of the evolving volume fraction, primary and secondary arm spacing, growth velocities, curvatures, will be discussed. The results are used to both inform and validate microstructural models of dendritic microstructure evolution.
||Planned: A print-only volume