| About this Abstract |
| Meeting |
Materials Science & Technology 2011
|
| Symposium
|
MS&T'11 Poster Session
|
| Presentation Title |
101 Atomistic Modeling of Dislocation-Interface Interactions |
| Author(s) |
Jian Wang |
| On-Site Speaker (Planned) |
Jian Wang |
| Abstract Scope |
The atomic structure of interfaces defines their properties. Geometric characters of habit planes mainly determine the characteristic of interface structures. Two geometric factors are chosen to classify interfaces: compact plane and compact direction. Using atomistic simulations we studied the characteristics of the five types of interfaces. Comparing the results among the five types of interfaces, we can conclude that (1) the interface plane is flat when one or two of the two habit planes is a compact plane. (2) The interface contains an array of interface disconnections when the compact directions in both crystals are parallel.(3) The interface plane becomes faceted when the compact directions in both crystals are parallel. (4) The interface plane is flat and composed of coherent and incoherent regions when atomic structures of unit cell in both crystals are similar. We then study the interfacial shear response and further simulate the dislocation-interface interactions. |
| Proceedings Inclusion? |
Undecided |