|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||K-29: Efficient High-Resolution Study of Dissimilar Metal Interfaces
||Genevieve Lee, Jonathan Orsborn, Antonio J Ramirez
|On-Site Speaker (Planned)
Transmission Kikuchi Diffraction (TKD) or transmission Electron Backscatter Diffraction (t-EBSD) yields crystallographic information past 10nm resolutions--rivaling conventional Transmission Electron Microscopy (TEM) methods-–at significantly larger areas in mere hours. This emerging technique, conducted in Scanning Electron Microscopes (SEM), uses electron-transparent thin foils rather than bulk samples typical to EBSD. This simple change reduces interaction volume while conventional EBSD software, hardware, and procedures remain unchanged. Paired with Energy Dispersive X-ray Spectroscopy (XEDS), crystallography and chemical composition is simultaneously assessed with remarkable spatial resolution. Such capabilities are instrumental in studying dissimilar material joints. Particularly solid-state produced joints exhibiting sub-micron features, the TKD-XEDS combination allows study with unprecedented area coverage and resolution. For example: fine M(CN) precipitates (~50nm) were identified across Ni-alloy to steel Friction Stir Welds (FSW); intermetallics in Al-alloy to steel FSW and Vapor Foil Actuator Welds (VFAW). Therefore, this unique TKD-XEDS combination drives fast, efficient characterization supporting subsequent high-resolution TEM analyses.
||Planned: Stand-alone book in which only your symposium’s papers would appear (indicate title in comments section below)