|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||In Operando Nano- and Micro-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
||Novel In-situ Mechanical Test within an X-ray Microscope
||Jürgen Gluch, Kristina Kutukova, Ehrenfried Zschech
|On-Site Speaker (Planned)
High-resolution X-ray imaging of samples during in situ mechanical testing provides novel information about the mechanical behavior of materials. We present a modular designed micro-mechanical test stage which is arranged within a laboratory-based X-ray microscope in such a way that the sample can be rotated, i. e. nano X-ray computed tomography is possible during stressing the sample. The stage allows to perform compression and tensile tests, and indentation as well, while recording radiographs.
With this dedicated test stage, it is possible to study crack initialization and crack propagation in samples with defined microstructure. The visibility of defects and cracks can be increased using the phase contrast imaging mode. Based on the kinetics of crack propagation, important information about several micro- and nano-structured materials and devices can be provided, e. g. degradation and failure mechanisms in fibre-reinforced composites and microelectronic devices.
||Planned: A print-only volume