|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||A Comparison of Gallium and Xenon Plasma Focused Ion Beam Techniques for the Interrogation of Aluminum Alloy Microstructures
||Alexis Ernst, Mei Wei,
|On-Site Speaker (Planned)
Over the last 20 years, dual-beam FIB instruments using liquid metal Ga ion sources have become essential tools for the microstructural characterization of materials. Factors that have contributed to this include: the integration of hardware for EDXS, EBSD and in situ lift-out of TEM specimens. While these approaches provide an invaluable insight into structural development in many materials systems, the maximum milling rates that can be achieved are insufficient for the analysis of some metallurgical systems die to the length scales involved. More recently, dual-beam FIB instruments have been developed with inductively coupled plasma Xe ion sources. These ion columns give milling rates that are 10-100x higher than for Ga ion columns, enabling much larger areas/volumes to be interrogated. Here we will compare the use of these two types of FIB instruments to study a range of advanced powder-processed Al alloys to demonstrate the relative advantages of the two approaches.
||Planned: Stand-alone book in which only your symposium’s papers would appear (indicate title in comments section below)