|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Mechanical Behavior at the Nanoscale III
||Mechanical Behaviors of Cu-based Metallic Multilayers with Crystalline/Amorphous Layer Interfaces
||Zhe Fan, Sichuang Xue, Haiyan Wang, Xinghang Zhang
|On-Site Speaker (Planned)
Nanostructured metallic multilayers have been intensely studied due to their potential to deliver high strength and excellent fatigue resistance. Most of the prior studies focus on interfaces between crystalline metals. In this study we present mechanical behaviors of metallic multilayers with crystalline/amorphous interfaces. Cu/Cu-based amorphous alloy multilayers were prepared by magnetron sputtering with equal individual layer thickness (h) varying from 1 to 200 nm. An obvious dependence of multilayers hardness on the individual layer thickness is observed. When h > 50 nm, the hardness of multilayers increases monotonically with decreasing h, following a Hall-Petch relation; whereas when h < 50nm, the hardness of the multilayers reach a plateau, but much lower than the hardness of the single layer amorphous film. The size dependent strengthening mechanisms and evolution of microstructures will be discussed.
||Planned: A print-only volume