|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Fracture Properties and Residual Stresses in Small Dimensions
||Nanoscale Strain Mapping of Individual Defects during In Situ Deformation
||Thomas Pekin, Colin Ophus, Christoph Gammer, Jim Ciston, Andrew Minor
|On-Site Speaker (Planned)
Recent advances in local strain mapping using nanobeam electron diffraction (NBED) has demonstrated the ability to observe single defects and the strain fields around them at a resolution of single nanometers. In addition to measuring the strength of small-volumes, measuring the evolution of strain during plastic deformation is of great importance for correlating the defect structure with material properties. This work will highlight our latest results from in situ strain mapping in an Al-Mg alloy and stainless steel using both contact loading methods (such as in situ nanopillar compression and nanoindentation) as well as non-contact methods such as tensile straining. Our method of local strain mapping consists of recording large multidimensional data sets of nanodiffraction patterns during the test. The resulting dataset contains diffraction data for every point of the STEM image, from which strain maps can be extrapolated on a scale not previously possible during in situ deformation.