|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Algorithm Development in Materials Science and Engineering
||Concepts, Data Bases and Analysis Tools for Dislocation Micro Structures Across the Length Scales
|On-Site Speaker (Planned)
Crystalline defects in metals and semiconductors are responsible for a wide range of mechanical, optical and electronic properties. Controlling the evolution of dislocations, i.e. line-like defects and the carrier of plastic
deformation, interacting both among themselves and with other microstructure elements allows tailoring material behaviors on the micro and nanoscale.
Despite all progress of simulation methods for dislocations - ranging from the atomic scale up to mesoscale methods - systematic data mining and comparison of data across different methods is almost impossible.
We present a unifying data-mining approach towards dislocations that links models and experiments on different length scales thereby guarantees true interoperability of different simulation methods and experiments.
||Planned: Supplemental Proceedings volume