About this Abstract |
Meeting |
2021 TMS Annual Meeting & Exhibition
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Symposium
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Mechanical Response of Materials Investigated through Novel In-situ Experiments and Modeling
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Presentation Title |
Quantifying Electron Beam Effects during In-situ TEM Nanomechanical Tensile Testing on Aluminum Thin Films |
Author(s) |
Sandra Stangebye, Olivier Pierron, Joshua Kacher |
On-Site Speaker (Planned) |
Sandra Stangebye |
Abstract Scope |
Transmission electron microscopy (TEM) imaging relies on high energy electrons for atomic scale resolution, however, the electrons themselves interact with and may alter the material being imaged. Using an in situ TEM MEMS-based nanomechanical tensile testing technique, the effect of the electron beam is investigated while deforming nanocrystalline aluminum thin films. Samples tested with repeated e-beam exposure (30 seconds exposed and 30 seconds no exposure) resulted in beam-induced stress relaxation and a three-time increase in plastic strain rate when the specimen is exposed to the e-beam. The observed effect was seen at 80 and 300 kV TEM accelerating voltages indicating that the effect is not due to knock on damage. True activation volume measurements increase on average from 9b3 with the beam on to 13b3 with the beam off. The differences in activation volume provides evidence that the e-beam may be changing the active deformation mechanism. |
Proceedings Inclusion? |
Planned: |