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Meeting 2019 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Imaging
Presentation Title Ultrahigh-speed X-ray Imaging for Studying Materials Structure Dynamics
Author(s) Tao Sun, Kamel Fezzaa
On-Site Speaker (Planned) Tao Sun
Abstract Scope The 32-ID-B beamline at the Advanced Photon Source (APS) is dedicated to ultrahigh-speed white beam full-field imaging experiments. By taking advantage of the time structure of the filling pattern in the storage ring, single-pulse imaging can be achieved with an exposure time set by the natural width of the pulse (down to 100 ps) and a frame rate set by the bunch repetition frequency (up to 6.5 MHz). Such “video-mode” ultrahigh-speed x-ray imaging allows to study highly transient, non-repeatable, and/or irreversible materials dynamics in processes, such as dynamic loading, combustion synthesis, materials machining, and additive manufacturing. In the presentation, I will first give a brief overview of the technique, beamline instrument, and associated user programs. Recent beamline developments and experiments on additive manufacturing will be highlighted. I will finish my talk by discussing the future opportunities of materials study using time-resolved x-ray techniques enabled by the APS Upgrade.
Proceedings Inclusion? Planned: Supplemental Proceedings volume


3D Mapping of Subgrains with High Resolution 3DXRD
A Fast Algorithm for Improving Reconstruction Quality with Incomplete Tomography Data
Advances in Fatigue Crack Growth Characterization via In Situ Phase Contrast Tomography Imaging
Coherent Diffraction Imaging at High X-ray Energies
Computational Investigation of Limits of Bragg Coherent Diffraction Imaging
Deep Learning of Inverse Problems in Scanning Transmission Electron Microscopy/Scattering
Deep Neural Networks for Feature Extraction and Image Reconstruction from Coherent X-ray Diffraction Imaging Data
Deformation Behavior of Functionally Graded Polymeric Foams Using X-ray Tomography
Direct Observation of Point to Parallel Array Cu GB Segregation Behavior in Al Alloy 7075
Examining Dzyaloshinskii Domain Walls in Asymmetric Pt/Co/Ni/Ir Superlattices Using Lorentz TEM
Exploring Ion-irradiation Damage Using Bragg Coherent X-ray Imaging and 3D Transmission Electron Microscopy
Hard X-ray Coherent Diffraction Imaging Using Nanoscale Focusing Optics
High Throughput Nano-size Precipitates Characterization of Steels with Unprecedented Statistics: Transmission Kikuchi Diffraction on Extraction Replicas
Identification and Visualization of Chemical Outliers through Scientific Data Mining in Nanoscale Spectro-microscopic Study of NMC Electrode
In Situ Loading of Engineered Materials during X-ray 3D Tomographic Imaging
Investigation of Helium Precipitates in Ta(Ti)/Zr(Ti) Composites Made by Solid Metal Dealloying
K-18: High-resolution Multi-modal Imaging Capability at the Hard X-ray Nanoprobe Beamline of NSLS-II
Learning CDI Reconstructions with Backpropagation
Materials Characterisation via Optical Ptychographic Imaging: Principles and Applications
Measurements of Irradiation Induced 3D Strain Field at the Nanoscale with X-ray Bragg Coherent Diffraction Imaging
Multi-angle Bragg Projection Ptychography with Probe Retrieval
Multi-modal 3D Imaging of LiNi1-x-yMnxCoyO2 Cathode Material with Concentration-gradient
Multi-reflection Bragg Coherent Diffractive Imaging of Real-world Materials Samples
Multimodal Imaging Using Hard X-ray Speckle
Photoelastic Ptychography for Anisotropic Imaging of Optically Transparent Samples
Recent Development of Full-field X-ray Microscope at NSLS-II - A Case of Battery Research
Revealing the Growth Dynamics of Nature’s Forbidden Crystals
Sparse Dictionary Learning Methods for Coherent X-ray Diffractive Imaging
STEM Diffraction Contrast Image Simulations for Complex Dislocation Configurations
Three-dimensional Imaging of Vortex Phases in Ferroic Materials
Ultrahigh-speed X-ray Imaging for Studying Materials Structure Dynamics
Understanding Catalyst Complexity at Synchrotron Light Sources Using Hard X-ray Ptychography and Tomography
X-ray Coherent Surface Scattering Imaging for Surface 3D Imaging and Material Characterization

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