|About this Abstract
||Materials Science & Technology 2017
||Fifty Years of Metallography and Materials Characterization
||Metallographic Analysis of Cu-Nb Nanolaminates Using Polarized Light Optical Microscopy
||Thomas Nizolek, Jacyln Avallone, Rodney McCabe, Nathan Mara, Irene Beyerlein, Tresa Pollock
|On-Site Speaker (Planned)
Light optical microscopy would seem ill-suited for characterizing Cu-Nb nanolaminates due to the technique’s inherent resolution limit and the ultra-fine structure (<250 nm) of these layered materials. Yet despite the cubic crystal structures of both Cu and Nb, these nanolaminates polarize reflected light when the layer thickness is below approximately 100 nm. Due to this optical anisotropy, polarized light microscopy can be used to determine the layer orientation in deformed specimens and to characterize local deformation bands known as kink bands. Insights into the morphology of kink bands in Cu-Nb nanolaminates gained from polarized light optical microscopy and electron microscopy will be discussed, with particular emphasis on the geometry of kink band intersections and terminations. These metallographic observations suggest that kink bands form via nucleation at a stress concentration followed by propagation across the specimen - a mechanism that is confirmed using in-situ imaging of compression specimens.
||Planned: Publication outside of MS&T