|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||In Operando Nano- and Micro-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
||Measurement of Micro Strains in Amorphous Ti45Al55 Thin Films using Selected Area Diffraction during in situ TEM Straining.
||Rohit Sarkar, Christian Ebner, Christian Rentenberger, Jagannathan Rajagopalan
|On-Site Speaker (Planned)
Micro strains in bulk metallic glasses have typically been determined using high-energy x-ray or neutron diffraction, by measuring relative shifts in the peak positions. Here, we measured the micro strain tensors of a 150 nm thick, amorphous Ti45Al55 film during in situ TEM straining by tracking geometric changes in the amorphous ring of the Selected Area Diffraction (SAD) pattern. The film was strained using a MEMS stage, which simultaneously allowed the measurement of the macroscopic strain and stress. Unlike x-ray or neutron diffraction, which probes relatively large volumes, this technique enabled us to measure micro strain from small regions (< 1.2 μm diameter) of the Ti45Al55 film and map the strain distribution across the specimen width. While the micro strain trends showed good agreement with the macro strain, there was notable variation in micro strain across the specimen width with values near the film edges exceeding those at the middle.
||Planned: A print-only volume