|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Coherent Imaging
||Coherent X-ray Diffraction Measurements of Lattice Distortions Caused by Ion Bombardment
||Felix Hofmann, Edmund Tarleton, Ross J Harder, Nicholas W Phillips, Jesse N Clark, Ian K Robinson, Brian Abbey, Wenjun Liu, Yevhen Zayachuk, Christian E Beck
|On-Site Speaker (Planned)
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. Using a tightly focussed ion beam, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across the life-, earth- and materials sciences. However, despite its widespread usage, detailed understanding of the functional consequences of FIB-induced damage, intrinsic to the technique, remains elusive. Here, we study the nano-scale strain fields brought about by FIB-exposure of initially pristine gold nano-crystals. Using Bragg Coherent Diffraction Imaging (BCDI), we measure the full, 3D-resolved lattice strain tensor within each nano-crystal. Even low gallium ion doses, typical of FIB imaging, cause substantial lattice distortions. At higher doses extended self-organised defect structures appear. Combined with detailed numerical calculations, these observations provide fundamental insight into the nature of the damage created, and the structural instabilities that lead to a surprisingly inhomogeneous morphology.
||Planned: Supplemental Proceedings volume