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Meeting 2017 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Coherent Imaging
Presentation Title Coherent X-ray Diffraction Measurements of Lattice Distortions Caused by Ion Bombardment
Author(s) Felix Hofmann, Edmund Tarleton, Ross J Harder, Nicholas W Phillips, Jesse N Clark, Ian K Robinson, Brian Abbey, Wenjun Liu, Yevhen Zayachuk, Christian E Beck
On-Site Speaker (Planned) Felix Hofmann
Abstract Scope Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. Using a tightly focussed ion beam, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across the life-, earth- and materials sciences. However, despite its widespread usage, detailed understanding of the functional consequences of FIB-induced damage, intrinsic to the technique, remains elusive. Here, we study the nano-scale strain fields brought about by FIB-exposure of initially pristine gold nano-crystals. Using Bragg Coherent Diffraction Imaging (BCDI), we measure the full, 3D-resolved lattice strain tensor within each nano-crystal. Even low gallium ion doses, typical of FIB imaging, cause substantial lattice distortions. At higher doses extended self-organised defect structures appear. Combined with detailed numerical calculations, these observations provide fundamental insight into the nature of the damage created, and the structural instabilities that lead to a surprisingly inhomogeneous morphology.
Proceedings Inclusion? Planned: Supplemental Proceedings volume

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

3D Imaging of High-pressure Induced Deformation Twinning in a Nanocrystal
3D X-ray Imaging of Defect Dynamics in Nanostructured Materials
Anisotropic Growth Patterns in Four Dimensions
Applications of High Resolution Coherent X-Ray Imaging Techniques for Investigating Additively Manufactured Materials
Biological and Bio-inspired Multifunctional Structural Materials
Biological Imaging Using Combined Ptychography and X-ray Fluorescence
Biomimetic CaCO3 Complex Morphologies Studied by Coherent X-ray Diffraction Imaging
Characterizing Evolving Processes through Coupled CDI and Molecular Dynamics Studies
Coherent Diffractive Imaging with Wavelength Spatial Resolution using 13.5nm High Harmonics: Full Field, High-contrast Imaging on a Tabletop
Coherent X-ray Diffraction Measurements of Lattice Distortions Caused by Ion Bombardment
Coherent X-ray Imaging at Future High Brightness Synchrotron Sources
High Resolution Coherent Imaging for Materials
High Speed Tomographic Imaging of Materials during Uniaxial Loading
Imaging Strain Fields by Ptychographic Topography
In-Situ and In-Operando Examination of Structure-Functional Relations in Porous Materials for Energy Conversion and Storage with Nano- and Micro- Synchrotron X-ray Computed Tomography
In-situ Deformation and Damage Assessment in Materials under Dynamic Loading Using High Speed Synchrotron X-ray Phase Contrast Imaging
In-situ Phase Contrast Nano-tomography at ID16B
Nanoscale 4D Microstructural Evolution of Precipitates in Aluminum Alloys Using Transmission X-Ray Microscopy (TXM)
Nanoscale Chemical Imaging of an Individual Catalyst Particle with Soft X-ray Ptychography
Phase Contrast Tomography to Document Gypsum Dehydration in Single Crystals and Polycrystalline Materials
Photoelastic Ptychography: A New Approach for Quantitative Stress Determination
Polychromatic Bragg Coherent X-ray Diffraction Imaging for Rapid Measurements
Progress towards Dichroic Bragg Coherent Diffractive Imaging
Real-time Direct and Diffraction Hard X-ray Imaging of Ultra-fast Processes
Revolutions in Coherent X-ray Sources Will Enable Dynamic Nanometer Scale Strain Imaging in Structural Materials
Soft-X-ray Ptychographic Imaging of Shale
Some Recent Advances in the Theory and Modeling of Phase Contrast Imaging
Speckle-based X-ray Imaging at Diamond Light Source
Unraveling the Structure-function Relationships in Ion Implanted Nanodiamonds
Zernike Phase Contrast for Hard X-ray Microscopy

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