|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Deformation and Transitions at Interfaces
||Residual Stress and Dislocation Density Distributions near Grain Boundaries in Deformed Materials
||Angus J. Wilkinson, Jun Jiang, T Ben Britton, David Wallis, Lars Hansen
|On-Site Speaker (Planned)
||Angus J. Wilkinson
Cross-correlation-based analysis of EBSD patterns allows variations in the elastic strain (hence stress) and lattice rotation tensors to be mapped at high spatial resolution in the SEM. Furthermore the lattice rotation gradients can be used to determine lower bound estimates of the geometrically necessary dislocation density. The datasets produced are well suited to exploring the accumulation of high stress and/or dislocation densities within a microstructure and plots showing their correlation with positional metrics such as distance to the nearest grain boundary or triple junction will be presented. Comparison will be made between datasets obtained from cubic metals eg fcc Cu deformed at room temperature and Si deformed at elevated temperatures. The effects of increased anisotropy as a consequence of lower symmetry will be explored in the hcp metals Ti and Zr and the orthorhombic mineral olivine.