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Meeting 2022 TMS Annual Meeting & Exhibition
Symposium Mechanical Response of Materials Investigated Through Novel In-Situ Experiments and Modeling
Presentation Title In Situ TEM Measurements of Electron-induced Creep in Amorphous Materials
Author(s) Sourav Das, Gowtham Sriram Jawaharram, Shen J. Dillon, Robert S. Averback
On-Site Speaker (Planned) Sourav Das
Abstract Scope Irradiation-induced creep in amorphous SiO2, Fe79B16Si5, Cu60Ta40 and Cu50Ti50 was measured during electron irradiation at room temperature, in situ, in a transmission electron microscope using a miniaturized beam bending apparatus. The TEM was operated using either 80 or 200 kV accelerating voltages, yielding maximum recoil energies below ≈ 15 eV. Molecular dynamics simulations (MD) were performed on amorphous Cu75Zr25 to provide the first detailed damage function for creating flow defects near threshold energies in a metallic glass. The damage function increased with recoil energy approximately as Tn (n ≈ 3-4) between 2 and 10 eV, before becoming linear in energy above ≈ 10 eV. Calculations of the creep rates for Cu60Ta40 and Cu50Ti50 using this model damage function provided good agreement with the experimental creep rates, but they underestimated those for SiO2 and Fe79B16Si5. Additional MD simulations of electron beam mixing help to explain these results.
Proceedings Inclusion? Planned:
Keywords Mechanical Properties, Modeling and Simulation, Characterization

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