|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Thermo-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
||Pushing the Envelope in Variable Temperature Nanoindentation: High and Cryogenic Temperature Measurements
||Nicholas Randall, Marcello Conte, Gaurav Mohanty, Jakob Schwiedrzik, Jeffrey Wheeler, Bertrand Bellaton
|On-Site Speaker (Planned)
This talk presents the design and development of a novel nanoindentation system that can perform reliable load-displacement measurements over a wide temperature range (from -150 to 800 °C) emphasizing the procedures required for performing accurate nanomechanical measurements. This system utilizes an active surface referencing technique comprising of two independent axes, one for surface referencing and another for indentation. The differential depth measurement technology results in negligible compliance of the system and very low thermal drift rates at high temperatures. The sample, indenter and reference tip are heated/cooled separately and the surface temperatures matched to obtain drift rates as low as 5nm/min at 800 °C. Instrumentation development, system characterization, experimental protocol, operational refinements and thermal drift characteristics over the temperature range will be presented. Extensive test results on a variety of materials will be shown. Finally, the current status and future roadmap for variable temperature nanoindentation testing will be summarized.
||Planned: Supplemental Proceedings volume