|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation Mechanisms
||Modeling the Evolution of Slip System Strength in α–Phase Ti-7Al Using High-Energy Diffraction Microscopy Data
||Darren Pagan, Nathan Barton, Paul Shade, Joel Bernier
|On-Site Speaker (Planned)
New high-energy X-ray diffraction techniques capable of measuring the elastic strain in hundreds of grains simultaneously have promised to change how micromechanical models are calibrated and advanced. In practice, using such large data sets for model development has proven to be difficult. Establishing new methods to link high-energy diffraction microscopy (HEDM) data and micromechanical models is crucial for optimal use of these new data. A method to extract the evolution of slip system strengths from different families of slip systems from HEDM data is presented. The method is used to quantify the evolution of slip system strengths in α–Phase Ti-7Al. The slip system strength data is then used to inform a micromechanical strength model. Finite element crystal plasticity results show the importance of accurate slip system strength values when attempting to capture individual grain stress behavior in Ti-7Al.
||Planned: Supplemental Proceedings volume