|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Interface-driven Phenomena in Solids: Thermodynamics, Kinetics and Chemistry
||Utilizing TEM-based Techniques to Map Strain Fields near Interfaces in Metals and Ceramics
||Paul Rottmann, Kevin Hemker, Kelvin Xie
|On-Site Speaker (Planned)
The TEM-based Topspin characterization suite (developed by NanoMEGAS and AppFive) allows for local strain mapping at a spatial resolution of 3nm and a strain sensitivity of 2×10-4. Topspin has found numerous applications in the semiconductor industry by quickly and reliably calculating residual elastic strains near coherent interfaces. This work will focus on using Topspin to locally measure the elastic strain at interfaces in metal and ceramic systems. Different types of interfaces and features (e.g. grain, twin, precipitate boundaries, triple points) can impose varying amounts of compressive or tensile strain on the surrounding matrix that will influence the overall properties of a material. We will present results demonstrating ways this technique can be used to obtain relevant structural information not easily obtainable through conventional TEM. The material systems to be considered are metal alloys (Al and Cu based) as well as commercially produced hot-pressed boron carbide.
||Planned: A print-only volume