| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Fatigue in Materials: Fundamentals, Multiscale Characterizations and Computational Modeling
|
| Presentation Title |
Volumetric Defect Quantification of Pure Aluminum During Fatigue Loading Below the Yield Stress |
| Author(s) |
Joseph Indeck, Jefferson Cuadra, Kavan Hazeli |
| On-Site Speaker (Planned) |
Joseph Indeck |
| Abstract Scope |
This research focuses of the evolution of bulk defects as a function of fatigue life in pure aluminum loaded below the yield stress, and what effect those defects have on subsequent mechanical behavior. Experimental studies have shown that fatigue induced substructures, such as persistent slip bands, can form at stress amplitudes well below the yield stress. Formation of PSBs and resultant internal microscopic changes are not constrained to the free surface and can influence the mechanical behavior. X-ray computed tomography was used to quantify internal void changes at different stages of the fatigue life. Then the pre-fatigued samples were tested under tension at quasi-static and dynamic strain rates in order to investigate the influence of fatigue-induced defects on the subsequent mechanical properties. Presented results connect size and distribution of internal voids with respect to the subsequent mechanical properties at various stages of fatigue life. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |