|About this Abstract
||Materials Science & Technology 2011
||Recent Advances in Structural Characterization of Materials
||Atom-Scale Characterization of the Chemistry and Structure of Material Transfer onto AFM Tips Resulting from Nanoscale Contact and Sliding Experiments
||Christopher J Tourek, Sriram Sundararajan
|On-Site Speaker (Planned)
While atomic force microscopy (AFM) based techniques have proved very useful in investigating nanotribological phenomena, a detailed assessment of the material structure and chemistry of the near apex region of the AFM tip can provide further insights. Specific areas that would directly benefit from this information include fabrication and friction/wear studies using AFM tips where material transfer and tip chemistry are of importance. Few techniques exist that can provide this critical information. We present our investigations utilizing atom probe tomography to successfully study the near apex regions of an AFM tip at the atomic scale. Further we report our initial observations on the formation of transferred material during dry sliding experiments involving a commercially available Si AFM tip on Cu. The effects of sliding distance and normal load on the formation of transferred material are also reported. The technique opens up a new avenue of investigation for AFM-related materials research.
||Definite: A CD-only volume