| About this Abstract |
| Meeting |
MS&T22: Materials Science & Technology
|
| Symposium
|
ACerS Richard M. Fulrath Award Session
|
| Presentation Title |
Advancing Solid State Reaction Science Through In Situ X-ray Diffraction and Processing Control |
| Author(s) |
Jacob L. Jones, J. Corrado Harper, Leah Bellcase, Rachel Broughton, Jennifer Forrester |
| On-Site Speaker (Planned) |
Jacob L. Jones |
| Abstract Scope |
Our ability to study and advance the science of solid state reactions relies on the tools and techniques with which we can monitor them. In situ X-ray diffraction (XRD) during the solid state reaction is a powerful technique that our research team has used for over a decade to understand the fundamental mechanisms underpinning the synthesis of perovskite oxides from starting oxides and carbonates. This presentation will highlight several examples of fundamental insight garnered from such measurements in important and emerging dielectric and ferroelectric materials including Na0.5Bi0.5TiO3 (NBT), NBT-BaTiO3, K0.5Na0.5NbO3, and BiFeO3-(Ba,Sr)TiO3. In NBT, for example, we find that Bi2O3 serves as a host particle that transforms into the NBT product, a parallel to how TiO2 converts to perovskite BaTiO3. In the other systems, we show important particle-particle interaction mechanisms that occur during and influence the formation of the perovskite phase. |