|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||Computational Polarized Light Microscopy Technique for Determining the C-axis Orientation of Uni-axial Materials
||Ke-Wei Jin, Marc De Graef
|On-Site Speaker (Planned)
Polarized light microscopy (PLM) has the advantage over other orientation indexing techniques, such as EBSD, in that it is low cost and has the ability to accommodate larger samples. PLM is widely used in the geological community and there is interest in expanding it to the characterization of uniaxial engineering materials such as titanium. The difference in refractive indices of hexagonal materials results in varying intensities of reflection when polarized light is incident upon the polished surface of the material. Images of the reflected intensities are recorded as a function of sample rotation, resulting in an intensity profile for each grain. The intensity profiles of grains are used to determine the orientation of the c-axis of each grain with respect to the sample surface normal. An EBSD run is used to verify the grain orientation determined using PLM.
||Planned: None Selected