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Meeting Materials Science & Technology 2020
Symposium Ceramic Matrix Composites
Presentation Title In Situ Observation of Crack Formation in CMCs Using X-ray Computed Tomography up to 1200°C
Author(s) Dong Liu, Jon Ell, Harold Barnard, Stefan Reh, Robert Ritchie
On-Site Speaker (Planned) Dong Liu
Abstract Scope A unique device permits in situ loading with real time X-ray computed tomography (XCT) imaging was used to study the deformation and fracture of a DLR WHIPOX CMC over a range of temperatures (RT, 900°C, 1050°C&1200°C). XCT scans were taken at multiple loading steps to capture the crack formation and propagation. The measured flexural strength was consistent with ex situ uniaxial tension and bending tests indicating the size of the samples used was adequate. The RT failure comprised of diffused fibre breakage accompanied by fibre/matrix delamination linking up existing pores. At 1050&1200°C, fibre/matrix delamination became the primary failure mechanism. Digital volume correlation (both local and global approaches) was used to derive the 3D displacement field and stress-strain behavior were extracted. Finally, residual stresses mapping in the fibre and matrix were conducted and the relaxation of these stresses was considered to have contributed to the high temperature delamination.

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Characterizing Environment-dependent Fracture Mechanisms of SiC-SiC CMCs via Novel Four-point Bend / Hermeticity Test Frame
In Situ Observation of Crack Formation in CMCs Using X-ray Computed Tomography up to 1200°C
Mechanically-robust, Oxidation-resistant, Thermally-cyclable Oxide/Metal Composites for Concentrated Solar Power
Processing and Characterization of Al /Al2O3 Metal Matrix Composites Produced Using Magnetic Field-Assisted Freeze Casting of Porous Ceramic Structures
Properties of Thermally Grown Borosilicate Glasses and Their Impact on CMC Oxidation and Life Prediction
Quantifying Damage Mechanisms by Observing Damage Evolution in SiC/SiC Composites using Micro-CT Techniques
Size-dependent Toughness and Strength in Defective SiC and Diamond Nanowires

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