|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Interface-driven Phenomena in Solids: Thermodynamics, Kinetics and Chemistry
||Grain Growth and Segregation in Hf-Ti Nanometallic Multilayers
||J. Sebastian Riano, Mikhail N. Polyakov, Andrea Maria Hodge
|On-Site Speaker (Planned)
||J. Sebastian Riano
Nanometalic materials have interesting mechanical, electrical, and magnetic properties, but generally exhibit low thermal stability due to the higher interface area which acts as a high diffusivity path, and is a suitable place for grain boundary stabilization by kinetic or thermodynamic mechanisms (segregation). Specifically, nanometalic multilayers (NMMs) are an attractive solution to enhance thermal stability, as they enable local control over kinetic phenomena (controlling alloying elements concentration), surface energy distribution, and grain size (layer thickness correlates with grain size).
This study presents the evolution of the interlayer interface of Hf-Ti NMMs samples prepared by magnetron sputtering, and heat treated at vacuum conditions, at different annealing times and temperatures. Microstructures and grain sizes of as-sputtered and heat treated samples were analyzed by TEM, and EDX profiles were used to track Hf and Ti composition. The loss of layered structure and grain boundary segregation for various layer thicknesses is presented.
||Planned: A print-only volume