About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Computational Thermodynamics and Kinetics
|
Presentation Title |
Controlling the Stability and Reliability Issues of the Electrical Responses of Resistive RAM and Neuromorphic Computing Devices: A Phase Field Study |
Author(s) |
Arijit Roy, Min-Gyu Cho, Hwi-Jae Cho, Pil-Ryung Cha |
On-Site Speaker (Planned) |
Arijit Roy |
Abstract Scope |
Organic and inorganic semiconducting systems are continuously being investigated to improve the performance of resistive RandomAccessMemory (ReRAM) and neuromorphic computing devices. Developing the new generation of memristor devices is challenging due to the involvement of various materials and processing issues. Application of electric field triggers the formation of conducting filament (CF) in memristive systems. We use phase field model to study morphological evolution of CF. We successfully simulate the voltage sweeping cycle mediated formation and breaking of CF leading to SET and RESET processes. We could also model voltage pulse mediated growth of CF, crucial for memory and learning experience behaviors in neuromorphic computation. We further validate our numerical results with experimental observations available in the literature. We believe such correlations of operation conditions with electrical responses -- responsible for device failure during endurance cycles and learning behavior during voltage pulsing cycles -- could shape the future of memristor research. |
Proceedings Inclusion? |
Planned: |
Keywords |
Computational Materials Science & Engineering, Modeling and Simulation, Electronic Materials |