|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Interface-driven Phenomena in Solids: Thermodynamics, Kinetics and Chemistry
||Cr Segregation on Grain Boundary Character and Intrinsic Stress Evolution in Fe(Cr) Nanocrystalline Films
||Xuyang Zhou, Tyler Kaub, Richard L. Martens, Gregory B. Thompson
|On-Site Speaker (Planned)
It is well established that material properties can be manipulated through grain boundary structure. In the present work, we report how Cr segregation in nanocrystalline Fe(Cr) thin films influences grain boundary character and intrinsic growth stresses. A series of Fe(Cr) films, with Cr varied up to ~8 at.%, were sputtered deposited. It was found that the film’s tensile stress was reduced by the incorporation of Cr. Coupling precession electron diffraction with atom probe tomography, we have been able to characterize Cr’s preferential migration to low and random high angle grain boundaries. Through this cross-correlation microscopy, we noted the reduction of Cr in the sigma-3 boundaries, which was the highest fraction of all special character boundaries formed. The role of Cr in facilitating this boundary migration and its effect on intrinsic thin film growth evolution is discussed.
||Planned: A print-only volume