|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Atom Probe Tomography for Advanced Characterization of Metals, Minerals and Materials
||Segregations at Defects and Interfaces and their Relations to Properties
||Baptiste Gault, Paraskevas Kontis, Huan Zhao, Alisson Kwiatowski da Silva, Surendra Kumar Makineni, Yanhong Chang, Dirk Ponge, Dierk Raabe
|On-Site Speaker (Planned)
Understanding the minutiae of the composition and structure of interfaces in materials is crucial to establish relationships with their properties. Modern techniques, such as atom probe tomography, are now able to provide insights into the local composition of interfaces with a high degree of accuracy. In this presentation, I will review the application of APT, sometimes directly correlated with electron microscopy, to reveal the chemistry of crystalline defects, interfaces and grain boundaries in Al-based, Ti-based and Fe-based, Co- and Ni-based alloys. Results from these investigations are discussed in relation to the resulting properties of the systems under scrutiny.
||Planned: Supplemental Proceedings volume